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1

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - The TDDB failure mode and its engineering study for 45nm and beyond in porous low k dielectrics direct polish scheme

Hsu, Chia-Lin, Lu, Kuan-Ting, Lin, Wen-Chin, Lin, Jeh-Chieh, Chen, Chih-Hsien, Tsai, Teng-Chun, Huang, Climbing, Wu, J Y, Perng, Dung-Ching

Year:

2010

Language:

english

File:

PDF, 449 KB

english, 2010

2

Effects of Post-CMP Cleaning on Time Dependent Dielectric Breakdown and Electro-Migration in Porous Low-k∕Cu Interconnects

Hsu, Chia-Lin, Perng, Dung-Ching, Lin, Wen-Chin, Lu, Kuan-Ting, Tsai, Teng-Chun, Huang, Climbing, Wu, J. Y.

Journal:

Journal of The Electrochemical Society

Year:

2011

Language:

english

File:

PDF, 302 KB

english, 2011

3

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - The TDDB Study of Post-CMP Cleaning Effect for L40 Direct Polished Porous Low K Dielectrics Cu Interconnect

Hsu, Chia-Lin, Lin, Welch, Hsu, Chun-Wei, Lin, Jen-Chieh, Tsai, Teng-Chun, Huang, Chien-Chung, Wu, J. Y., Perng, Dung-Ching

Year:

2010

Language:

english

File:

PDF, 205 KB

english, 2010

4

[IEEE 2019 International Conference on Machine Learning and Cybernetics (ICMLC) - Kobe, Japan (2019.7.7-2019.7.10)] 2019 International Conference on Machine Learning and Cybernetics (ICMLC) - Real-Time Car Detection and Driving Safety Alarm System With Google Tensorflow Object Detection API

Hsieh, Cheng-Hsiung, Lin, Dung-Ching, Wang, Cheng-Jia, Chen, Zong-Ting, Liaw, Jiun-Jian

Year:

2019

Language:

english

File:

PDF, 397 KB

english, 2019

5

Microstructural, Electrical, and Mechanical Properties of Graphene Films on Flexible Substrate Determined by Cyclic Bending Test

Nguyen, Ba-Son, Lin, Jen-Fin, Perng, Dung-Ching

Journal:

ACS Applied Materials & Interfaces

Year:

2014

Language:

english

File:

PDF, 3.85 MB

english, 2014

6

[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - Defect study of manufacturing feasible porous low k dielectrics direct polish for 45nm technology and beyond

Hsu, Chia-Lin, Fang, Jeng Yu, Art Yu,, Jack Lin,, Climbing Huang,, Wu, J. Y., Perng, Dung-Ching

Year:

2009

Language:

english

File:

PDF, 2.80 MB

english, 2009

7

1-nm-thick graphene tri-layer as the ultimate copper diffusion barrier

Nguyen, Ba-Son, Lin, Jen-Fin, Perng, Dung-Ching

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.62 MB

english, 2014

8

Electrochemical Studies of W Corrosion for Low Resistive Contact in the 28 nm Technology Node

Hsu, Chia-Lin, Perng, Dung-Ching, Chen, Yen-Ming, Huang, Shu-Min, Li, Yu-Ting, Kung, Chang-Hung, Lin, Chih-Hsun, Yang, Yu-Ru, Lin, Chin-Fu, Huang, Climbing, Wu, J. Y.

Journal:

Journal of The Electrochemical Society

Year:

2012

Language:

english

File:

PDF, 212 KB

english, 2012

9

Non-vacuum growth of graphene films using solid carbon source

Nguyen, Ba-Son, Lin, Jen-Fin, Perng, Dung-Ching

Journal:

Applied Physics Letters

Year:

2015

Language:

english

File:

PDF, 1.30 MB

english, 2015

10

High-performance ultraviolet detection and visible-blind photodetector based on Cu 2 O/ZnO nanorods with poly-( N -vinylcarbazole) intermediate layer

Perng, Dung-Ching, Lin, Hsueh-Pin, Hong, Min-Hao

Journal:

Applied Physics Letters

Year:

2015

Language:

english

File:

PDF, 1.07 MB

english, 2015

11

Electrodeposited CuSCN metal-semiconductor-metal high performance deep-ultraviolet photodetector

Lin, Hsueh-Pin, Lin, Xuan-Jun, Perng, Dung-Ching

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 1.35 MB

english, 2018

12

Fast-Response and Self-Powered Cu 2 O/ZnO Nanorods Heterojunction UV-Visible (570 nm) Photodetectors

Lin, Hsueh-Pin, Lin, Po-Yi, Perng, Dung-Ching

Journal:

Journal of The Electrochemical Society

Year:

2020

File:

PDF, 1.13 MB

2020

13

PM2.5 Concentration Estimation Based on Image Processing Schemes and Simple Linear Regression

Liaw, Jiun-Jian, Huang, Yung-Fa, Hsieh, Cheng-Hsiung, Lin, Dung-Ching, Luo, Chin-Hsiang

Journal:

Year:

2020

File:

PDF, 4.88 MB

2020